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Open eVision
General Features

Open eVision Accessories
Evaluation
Learning
Development

Libraries
EasyImage
EasyColor
EasyObject
EasyMatch
EasyFind
EasyGauge
EasyOCV
EasyOCR
EasyBarCode
EasyMatrixCode

Licensing
Licensing System

New Acquisition Front Ends
ActiveGigE for Open eVision
ActiveDcam for Open eVision Evaluation Programs

Data Sheet

Free evaluation of
the Open eVision
functionalities

Sub-pixel Measurement and Dimension Control Sub-pixel Measurement & Dimension Control Library
Main Features Typical Applications
Sub-pixel point location and edge fitting Gauging applications
Highly accurate and robust Calibration metrology
Advanced and automatic calibration Assembly inspection
Multiple gauge models
Position, orientation, size, curvature, distances
Graphical model edition

EasyGauge is a cutting-edge measurement and dimension control library for use in gauging and metrology applications. By relying on proven sub-pixel edge detection and shape fitting algorithms, it allows determining the dimension, position, curvature, size, angle or diameter of manufactured parts with an excellent accuracy. Robustness is ensured by powerful edge-point selection mechanisms that are intuitive and easy to tune, allowing measurement in cluttered images. In addition to these state-of-the-art features, EasyGauge also supports the automatic measurement of parallel sides, thus providing means of measuring the thickness of flat or bent objects, as well as the precise location of corners.

Advanced and Automatic Calibration

EasyGauge has advanced built-in calibration capabilities to transparently convert pixel measurements to physical units; this relieves the user of the need to convert coordinates. Non-square pixels and rotated coordinate axis are supported. EasyGauge also provides means to determine and correct perspective and optical distortion, with no performance loss.

Gauge Grouping

EasyGauge supports grouping of the measurement gauges and lets these groups track the measured items in the image. These can freely translate and/or rotate while the probes are repositioned accordingly. Derived measurements such as distances between feature points can then be computed.

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