|
|
HOME
WHERE TO BUY
SITE MAP
LINKS
SEARCH
Open eVision
General Features
Evaluation
Learning
Development
EasyImage
EasyColor
EasyObject
EasyMatch
EasyFind
EasyGauge
EasyOCV
EasyOCR
EasyBarCode
EasyMatrixCode
Data Sheet
|
|
|
Geometric Pattern Matching Library
|
|
Main Features
|
Typical Applications
|
|
|
Feature point technology
|
Presence, absence
|
|
Fully automatic, fast and robust
|
Alignment
|
|
Rotation and scaling invariant
|
Pick and place
|
|
High tolerance to pattern degradation
|
Printing industry
|
|
Don't care areas
|
|
|
User-defined pivot point
|
|
|
|
|
Based on an innovative feature-point technology, EasyFind is designed to rapidly find one or more instances of a reference model
in the image. Compared to classical algorithms, EasyFind features faster processing and improved robustness. Euresys’ geometric
pattern finder shows excellent performances when handling instances that are highly degraded due to noise, blur, occlusion,
missing parts or unstable illumination conditions. With an adjustable accuracy up to sub-pixel level, EasyFind reports very precise
information about the instances found, such as their location, rotation angle, scale and matching score. EasyFind supports don’t
care areas. This feature allows the creation of complex pattern shapes.
|
|
|
|
Fast Processing and Improved Robustness
|
|
EasyFind is based on a novel feature-point technology. Instead of comparing
the reference model to the sample image pixel-wise, it carefully
selects salient features in the model. This method allows EasyFind to
match only the areas that convey valuable information, resulting in faster
processing and much improved robustness.
|
|
|
EasyFind also brings a new approach to the problem of detecting insufficiently
defined models in an image by proposing three selectable pattern types:
|
|
|
Consistent edges
|
|
|
This mode is used for patterns with well defined edges or to find
non deformed instances. It detects instances highly degraded due to
blur, noise, occlusion or varying illumination conditions.
|
|
A point by point scoring method makes this operating mode more resilient to large occlusions and/or
large variations of contrast. It also globally reduces the computation time of the finding phase.
|
|
|
Thin structure
|
|
|
This mode is used to locate patterns including particularly thin structures. It is robust against blur, noise,
occlusion and illumination variation.
|
|
|
Contrasting regions
|
|
|
This mode is used for patterns with poorly defined edges or patterns exhibiting noise, blur, and random
texture. The contrasting regions pattern type is robust against blur, noise, illumination variation. These three
pattern types allow EasyFind to maximize the accuracy and the speed of the processing, even in difficult
cases.
|
|
|
These three pattern types allow EasyFind to maximize the accuracy and the speed of the processing, even in difficult cases.
|
|
|
|
|
|
|
|